High-Accuracy based on Deep Learning Techniques for Pattern Recognition of Wafer Defect. Journal of Global Research in Electronics and Communications(JGREC), [S. l.], v. 2, n. 2, p. 22–27, 2026. DOI: 10.5281/. Disponível em: https://jgrec.info/index.php/jgrec/article/view/111. Acesso em: 7 feb. 2026.