Improving Fault Detection Accuracy in Semiconductor Manufacturing with Machine Learning Approaches. Journal of Global Research in Electronics and Communications(JGREC), [S. l.], v. 1, n. 1, p. 20–25, 2025. DOI: 10.5281/zenodo.14935091. Disponível em: https://jgrec.info/index.php/jgrec/article/view/18. Acesso em: 30 aug. 2025.