Applications of Deep Learning Approaches for Defect Identification Trends, Challenges, and Future Directions. Journal of Global Research in Electronics and Communications(JGREC), [S. l.], v. 1, n. 10, p. 30–36, 2025. DOI: 10.5281/zenodo.17422939. Disponível em: https://jgrec.info/index.php/jgrec/article/view/71. Acesso em: 27 oct. 2025.